A New Type of Atomic Force Microscope
نویسندگان
چکیده
6 Local flow variation (LFV) method of nonlinear time series analysis is applied to 7 develop a chaotic motion based atomic force microscope (AFM). The method is 8 validated by analyzing time series from a simple numerical model of a tapping mode 9 AFM. For both calibration and measurement procedures the simulated motions of 10 the AFM are nominally chaotic. However, the distance between a tip of the AFM 11 and a sample surface is still measured accurately. The LFV approach is independent 12 of any particular model of the system and is expected to be applicable to other 13 micro-electro-mechanical system sensors where chaotic motions are observed or can 14 be introduced. 15
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تاریخ انتشار 2008